Test head
Description:
These test heads are used to support high-speed testing of complex devices at extreme temperatures. The circuitry contained includes voltage, current and function generation to test the devices while they are in an environmental chamber and the test head is maintained at room temperature. Signal conditioning ensures that the computer test system can get useful data from a relatively long distance.
Application:
EBD has developed the packaging of these devices with the flexibility to work in any industry where high speed component testing is required.
Design Highlights:
The test heads can be latched into position and removed without tools. Internal fans keep the electronics cool.
Benefit:
Places the test-related electronics close to the device under test (DUT) to increase test and data acquisition speed and improve overall throughput.